用于Functional Test 的IC测试分类，具有高产能、高稳定性。支持IC芯片在不同环境（常温、高温），进行8site 并行测试分选。
| Model | EXCEED6040 | EXCEED6080 | EXCEED6040H | EXCEED6080H |
|---|---|---|---|---|
| Test Layout | 1/2/4 site | 1/2/4/8 site | 1/2/4 site | 1/2/4/8 site |
| Power Supply | Single phase 220V 50/60Hz 30A | Single phase 220V 50/60Hz 50A | ||
| Temp type | Ambient temp | High/Ambient temp | ||
| Pick-up head | 2x2 module | |||
| UPH | Max.8500 | |||
| Index Time | Min.380ms | |||
| Contact Force | 120KG (Option: 240KG) | |||
| SOCKET Opening | 210mmx140 mm | |||
| Dimension | 1700Lx1400Wx1890H(mm) | |||
| Weight | Appox.1000kg | |||
| PKG Type | QFN,QFP,BGA,LGA,PLCC,PGA, CSP,TSOP etc. | |||
| PKG Size | From 2x2 to 70x70 mm | |||
| Jam Rate | <1 /10000 | |||
| Tray Type | Jdec | |||
| Temp Range | +50degC to +100degC ±2degC; +100degC to +130degC ±3degC | |||
| Num Of Sorting | Auto Tray×3，Fix Tray×3 | |||
| Tester Interface | GPIB ,TTL, RS232 ,Network | |||
